Apostolos Antonacopoulos | University of Salford, UK |
Steven Bagley | University of Nottingham, UK |
Uwe Borghoff | Univ German Fed. Armed Forces, Germany |
David Brailsford | University of Nottingham, UK |
Dick Bulterman | CWI, Netherlands |
Tyng-Ruey Chuang | Academia Sinica Taipei, Taiwan |
Richard Furuta | Texas A&M University, USA |
Michael Collard | Kent State University, USA |
Michael Gormish | Ricoh Innovations, USA |
Matthew Hardy | Adobe, USA |
Steven J. Harrington | Xerox, USA |
Roger Hersch | EPFL, Lausanne, Switzerland |
Nathan Hurst | Monash University, Australia |
Rolf Ingold | Université de Fribourg, Switzerland |
Peter King | University of Manitoba, Canada |
Jacques Le Maitre | Université du Sud Toulon-Var, France |
John Lumley | Hewlett Packard, UK |
Veronica Lux | INIST-CNRS, France |
Ethan V. Munson | University of Wisconsin-Milwaukee, USA |
Jocelyne Nanard | Université de Montpellier, France |
Charles Nicholas | U. of Maryland Baltimore County, USA |
Markus Noga | Booz Allen Hamilton, Germany |
Moira Norrie | ETH Zurich, Switzerland |
Tom Phelps | University of Liverpool, UK |
Maria da Graça Pimentel | Universidade de São Paulo, Brazil |
Kris Popat | PARC, USA |
Steve Probets | Loughborough University, UK |
Vincent Quint | INRIA Rhône-Alpes, France |
Samuel Rebelsky | Grinnell College, USA |
Cécile Roisin | U. Pierre Mendès-France & INRIA, France |
Lloyd Rutledge | CWI, Netherlands |
Steven Simske | Hewlett Packard, USA |
Luiz Fernando Gomes Soares | PUC Rio, Brazil |
Margaret Sturgill | Hewlett Packard, USA |
Frank Tompa | University of Waterloo, Canada |
Christine Vanoirbeek | EPFL, Lausanne, Switzerland |
Anne-Marie Vercoustre | INRIA Rocquencourt, France |
Jean-Yves Vion-Dury | Xerox Research Centre Europe, France |
Raymond Wong | University of New South Wales, Australia |